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Scanning Electron Microscope & Energy Dispersive Spectroscopy
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Scanning Electron Microscope & Energy Dispersive Spectroscopy

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EMAX Elemental Analysis System.
Analyze sample components by means of X-Ray and calculate the percentage composition of these components based on the spectrum from reflection chart.
Images can be magnified 40 to 10000 times and observing scope 5μm-1mm
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EMAX Elemental Analysis System.

Analyze sample components by means of X-Ray and calculate the percentage composition of these components based on the spectrum from reflection chart.

Images can be magnified 40 to 10000 times and observing scope 5μm-1mm,

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Add:#161, KejizhongRd., Shijie,Dongguan City,Guangdong, China
Tel:0086-797 357 2666 / 400-838-6928
E-mail:[email protected] / [email protected]

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Jiangxi Zhihao Electronic Technology Co., Ltd

Address: Xinzhen Industrial Park, Longnan ec, GanZhou City,GanZhou City, Jiangxi, China (341700)
Tel: (86 0797) 3572666     Fax: (86 0797) 3572666   
E-mail: [email protected]  / [email protected]