Number of views:
1000
Scanning Electron Microscope & Energy Dispersive Spectroscopy
Retail price
0.0
元
Market price
0.0
元
Analyze sample components by means of X-Ray and calculate the percentage composition of these components based on the spectrum from reflection chart.
Images can be magnified 40 to 10000 times and observing scope 5μm-1mm
Product serial number
Category
Testing equipment
Quantity
-
+
Stock:
0
EMAX Elemental Analysis System.
Analyze sample components by means of X-Ray and calculate the percentage composition of these components based on the spectrum from reflection chart.
Images can be magnified 40 to 10000 times and observing scope 5μm-1mm,
1
Scan the QR code to read on your phone
Previous
Atom Absorption Spectrophotometer
Next
3D Microscope
Website
Add：#161, KejizhongRd., Shijie,Dongguan City,Guangdong, China
Tel：0086-797 357 2666 / 400-838-6928
E-mail：grl@topcb.com.cn / web@topcb.com.cn
Copyright © 2019 Wuzhu Technology Co., Ltd. 粤ICP备15063227号
Jiangxi Zhihao Electronic Technology Co., Ltd
Address: Xinzhen Industrial Park, Longnan ec, GanZhou City,GanZhou City, Jiangxi, China (341700)
Tel: (86 0797) 3572666 Fax: (86 0797) 3572666
E-mail： web@topcb.com.cn / grl@topcb.com.cn